Electrical conductivity measurements in evaporated tin sulphide thin films

• Main Authors: Deraman, Karim, Sakrani, Samsudi, Ismail, B. B., Wahab, Yusof, Gould, R. D.
• Format: Article
• Language: English
• Published: Taylor & Francis 1994
• Subjects: QC Physics
• Online Access: http://eprints.utm.my/id/eprint/2620/1/international_jurnal_of_electronic.pdf; http://eprints.utm.my/id/eprint/2620/

Tin sulphide (SnS) has been evaporated on to substrates maintained at fixed temperature in the range 50-300 oC. X-ray diffraction measurements have shown that the films deposited at the lower substrate temperatures are non-stoichiometric, containing higher sulphides of tin, but that those deposited...