An extended class of acyclically testable circuits

• المؤلفون الرئيسيون: Oka, Nobuyo, Chia, Yee Ooi, Ichihara, Hideyuki, Inoue, Tomoo, Fujiwara, Hideo
• التنسيق: Conference or Workshop Item
• منشور في: 2007
• الموضوعات: TK Electrical engineering. Electronics Nuclear engineering
• الوصول للمادة أونلاين: http://eprints.utm.my/id/eprint/13732/

This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose test generation complexity is equivalent to that of the acyclic sequential circuits. We also present a test generation proce...