A new class of sequential circuits with acyclic test generation complexity

• Main Authors: Ooi, Chia Yee, Fujiwara, Hideo
• Format: Conference or Workshop Item
• Published: 2006
• Online Access: http://eprints.utm.my/id/eprint/9169/; http://dx.doi.org/10.1109/ICCD.2006.4380851

This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose test generation complexity is equivalent to that of the acyclic sequential circuits. We also present a test generation proce...