Mathematical modelling and optimization of multisite efficiency to reduce cost of test in semiconductor final test process using Taguchi method

• Main Author: Khoo, Voon Ching
• Format: Thesis
• Language: English
• Published: 2021
• Subjects: T Technology (General)
• Online Access: http://eprints.utm.my/108141/1/KhooVoonChingPFTIR2021.pdf; http://eprints.utm.my/108141/; http://dms.library.utm.my:8080/vital/access/manager/Repository/vital:156359

This study proposes improved equations for semiconductor multisite testing process. It contributes to the derivation of the new equations which have better prediction accuracy of multisite efficiency (MSE), testing throughput, and cost of test than the conventional ones to enable accurate conduct of...