A Cost of Test Case Study for Wafer-Ring Multi-Sites Test Handler in Semiconductor’s Industry Through Theory of The Firm
In this research, the author conducted the cost of test study for the wafer-ring test handler in semiconductor’s industry with theory of the firm model. A cost of test model have been developed through the theory of the firm average cost theory by integrated the technology aspect into it so that the...
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| Main Author: | |
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| Format: | Journal |
| Language: | English |
| Published: |
2015
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| Online Access: | http://ur.aeu.edu.my/1004/1/2855-Article%20Text-11199-1-10-20150209.pdf http://ur.aeu.edu.my/1004/ |
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