Probing the electronic properties of Cu and CuO thin films via XANES utilizing powder XRD system
This research introduces an alternative approach on materials characterization by developing an in-house X-ray Absorption Spectroscopy (XAS) system utilizing powder X-ray Diffraction (XRD) machine. The performance of the in-house XAS system was investigated by analysing the position of Cu K-edge and...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Penerbit UTM Press
2023
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| Subjects: | |
| Online Access: | http://eprints.utm.my/105357/1/MuhammadFirdausOmar2023_ProbingtheElectronicPropertiesofCuandCuO.pdf http://eprints.utm.my/105357/ http://dx.doi.org/10.11113/mjfas.v19n6.3143 |
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