Probing the electronic properties of Cu and CuO thin films via XANES utilizing powder XRD system

This research introduces an alternative approach on materials characterization by developing an in-house X-ray Absorption Spectroscopy (XAS) system utilizing powder X-ray Diffraction (XRD) machine. The performance of the in-house XAS system was investigated by analysing the position of Cu K-edge and...

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Bibliographic Details
Main Authors: Saniman, Siti Sarah, Omar, Muhammad Firdaus
Format: Article
Language:English
Published: Penerbit UTM Press 2023
Subjects:
Online Access:http://eprints.utm.my/105357/1/MuhammadFirdausOmar2023_ProbingtheElectronicPropertiesofCuandCuO.pdf
http://eprints.utm.my/105357/
http://dx.doi.org/10.11113/mjfas.v19n6.3143
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