Microstructural studies of Cu-Al Intermetallic Compound at Thermosonic Wire Bonding Interface
Cu-Al intermetallic compound (IMC) in Cu wire-Al bond pad bonding interface has been an area of interest for researchers. In this paper, characterization of IMC at bonding interface of annealed diode micro-chip has been performed using Scanning Electron Microscope (SEM), Transmission Electron Micros...
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Main Authors: | , , , , |
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Format: | Conference or Workshop Item |
Language: | English |
Published: |
2012
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Subjects: | |
Online Access: | http://eprints.utem.edu.my/id/eprint/6959/1/idecon2012_Anand_105.pdf http://eprints.utem.edu.my/id/eprint/6959/ http://idecon.utem.edu.my/ |
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