High-performance, fault-tolerant architecture for reliable hybrid nanolectronic memories
Although hybrid nanoelectronic memories (hybrid memories) promise scalability potentials such as ultrascale density and low power consumption, they are expected to suffer from high defect/fault density reducing their reliability. Such defects/faults can impact any part of the memory system including...
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Penerbit Universiti Teknikal Malaysia Melaka
2012
|
| Subjects: | |
| Online Access: | http://eprints.utem.edu.my/id/eprint/6764/1/JETC12_published.pdf http://eprints.utem.edu.my/id/eprint/6764/ https://jtec.utem.edu.my/jtec/article/view/430/299 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|