Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films.
The growth of intermetallic phases in Al/Cu bilayers thin film having 2/3 layer thickness ratios were characterized by X-ray powder diffraction (XRD), energy dispersive X-ray (EDX) and transmission electron microscopy (TEM). In annealing temperature of 200 oC, the growth is controlled by Cu diffusio...
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my.utem.eprints.109702015-05-28T04:14:34Z http://eprints.utem.edu.my/id/eprint/10970/ Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films. Mohd Rosli, ZULKIFLI halim, z azizi, mat yajid ali, R Q Science (General) T Technology (General) The growth of intermetallic phases in Al/Cu bilayers thin film having 2/3 layer thickness ratios were characterized by X-ray powder diffraction (XRD), energy dispersive X-ray (EDX) and transmission electron microscopy (TEM). In annealing temperature of 200 oC, the growth is controlled by Cu diffusion which resulted to formation of θ- Al2Cu, η- AlCu, ζ- Al3Cu4 and γ-Al4Cu9 phase. 2014 Article PeerReviewed application/pdf en http://eprints.utem.edu.my/id/eprint/10970/1/AMR.845.221_Azizi.pdf Mohd Rosli, ZULKIFLI and halim, z and azizi, mat yajid and ali, R (2014) Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films. Advanced Materials Research. pp. 221-225. ISSN 1022-6680 |
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Q Science (General) T Technology (General) Mohd Rosli, ZULKIFLI halim, z azizi, mat yajid ali, R Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films. |
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The growth of intermetallic phases in Al/Cu bilayers thin film having 2/3 layer thickness ratios were characterized by X-ray powder diffraction (XRD), energy dispersive X-ray (EDX) and transmission electron microscopy (TEM). In annealing temperature of 200 oC, the growth is controlled by Cu diffusion which resulted to formation of θ- Al2Cu, η- AlCu, ζ- Al3Cu4 and γ-Al4Cu9 phase. |
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Article |
author |
Mohd Rosli, ZULKIFLI halim, z azizi, mat yajid ali, R |
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Mohd Rosli, ZULKIFLI halim, z azizi, mat yajid ali, R |
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Mohd Rosli, ZULKIFLI |
title |
Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films. |
title_short |
Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films. |
title_full |
Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films. |
title_fullStr |
Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films. |
title_full_unstemmed |
Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films. |
title_sort |
investigation of intermetallic phase formation and structural analysis in annealed al/cu bilayer thin films. |
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2014 |
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http://eprints.utem.edu.my/id/eprint/10970/1/AMR.845.221_Azizi.pdf http://eprints.utem.edu.my/id/eprint/10970/ |
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