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Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films.

The growth of intermetallic phases in Al/Cu bilayers thin film having 2/3 layer thickness ratios were characterized by X-ray powder diffraction (XRD), energy dispersive X-ray (EDX) and transmission electron microscopy (TEM). In annealing temperature of 200 oC, the growth is controlled by Cu diffusio...

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Main Authors: Mohd Rosli, ZULKIFLI, halim, z, azizi, mat yajid, ali, R
Format: Article
Language:English
Published: 2014
Subjects:
Q Science (General)
T Technology (General)
Online Access:http://eprints.utem.edu.my/id/eprint/10970/1/AMR.845.221_Azizi.pdf
http://eprints.utem.edu.my/id/eprint/10970/
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spelling my.utem.eprints.109702015-05-28T04:14:34Z http://eprints.utem.edu.my/id/eprint/10970/ Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films. Mohd Rosli, ZULKIFLI halim, z azizi, mat yajid ali, R Q Science (General) T Technology (General) The growth of intermetallic phases in Al/Cu bilayers thin film having 2/3 layer thickness ratios were characterized by X-ray powder diffraction (XRD), energy dispersive X-ray (EDX) and transmission electron microscopy (TEM). In annealing temperature of 200 oC, the growth is controlled by Cu diffusion which resulted to formation of θ- Al2Cu, η- AlCu, ζ- Al3Cu4 and γ-Al4Cu9 phase. 2014 Article PeerReviewed application/pdf en http://eprints.utem.edu.my/id/eprint/10970/1/AMR.845.221_Azizi.pdf Mohd Rosli, ZULKIFLI and halim, z and azizi, mat yajid and ali, R (2014) Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films. Advanced Materials Research. pp. 221-225. ISSN 1022-6680
institution Universiti Teknikal Malaysia Melaka
building UTEM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknikal Malaysia Melaka
content_source UTEM Institutional Repository
url_provider http://eprints.utem.edu.my/
language English
topic Q Science (General)
T Technology (General)
spellingShingle Q Science (General)
T Technology (General)
Mohd Rosli, ZULKIFLI
halim, z
azizi, mat yajid
ali, R
Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films.
description The growth of intermetallic phases in Al/Cu bilayers thin film having 2/3 layer thickness ratios were characterized by X-ray powder diffraction (XRD), energy dispersive X-ray (EDX) and transmission electron microscopy (TEM). In annealing temperature of 200 oC, the growth is controlled by Cu diffusion which resulted to formation of θ- Al2Cu, η- AlCu, ζ- Al3Cu4 and γ-Al4Cu9 phase.
format Article
author Mohd Rosli, ZULKIFLI
halim, z
azizi, mat yajid
ali, R
author_facet Mohd Rosli, ZULKIFLI
halim, z
azizi, mat yajid
ali, R
author_sort Mohd Rosli, ZULKIFLI
title Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films.
title_short Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films.
title_full Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films.
title_fullStr Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films.
title_full_unstemmed Investigation of Intermetallic Phase Formation and Structural Analysis in Annealed Al/Cu Bilayer Thin Films.
title_sort investigation of intermetallic phase formation and structural analysis in annealed al/cu bilayer thin films.
publishDate 2014
url http://eprints.utem.edu.my/id/eprint/10970/1/AMR.845.221_Azizi.pdf
http://eprints.utem.edu.my/id/eprint/10970/
_version_ 1665905443329802240
score 13.18916

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