Contaminants on Electrical Contacts Used in Semiconductor Device Testing

• Main Authors: SAID, MD RADZAI, Tan, CheeFai
• Format: Article
• Language: English
• Published: IDOSI Publications 2013
• Subjects: TJ Mechanical engineering and machinery
• Online Access: http://eprints.utem.edu.my/id/eprint/10662/1/J_WASJ_2013_mrs-ccc-cft.pdf; http://eprints.utem.edu.my/id/eprint/10662/

Electrical contacts used in semiconductor device testing are often deposited with a small pip of dark colour contaminants after being subjected to repeating cycles of impact loading. Samples of used electrical contacts are checked under SEM and EDX. It is discovered that the contaminants contain hig...