Multiple and solid data background scheme for testing static single cell faults on SRAM memories

• Main Author: Zakaria, Nor Azura
• Format: Thesis
• Language: English
• Published: 2013
• Subjects: Metal oxide semiconductors, Complementary; Computer storage devices - Design and construction
• Online Access: http://psasir.upm.edu.my/id/eprint/84183/1/FK%202013%20142%20-%20ir.pdf; http://psasir.upm.edu.my/id/eprint/84183/

Memory testing is a method that requires an algorithm capable of detecting faulty memory as comprehensively as possible to facilitate the efficient manufacture of fault free memory products. Therefore, the purpose of this thesis is to introduce a Data Background (DB) scheme to generate an optimal...