Solder bump strength and failure mode of low-k flip chip device
In this paper, the failure mode and solder bump strength for low-k flip chip devices were determined using die pull technique. The results show there is no significant difference between low-k and non low-k devices in terms of bumps strength for the amount of taffy in this device. However, there is...
Saved in:
Main Authors: | , , , |
---|---|
Format: | |
Published: |
2017
|
Online Access: | http://dspace.uniten.edu.my:8080/jspui/handle/123456789/5305 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|