Implementation of low-cost reconfigurable external mixed-signal VLSI circuit testing system

• Main Authors: Islam S.Z., Ali M.A.M.
• Other Authors: 55432804400
• Format: Article
• Published: Institution of Engineers (Australia) 2023
• Subjects: Automatic testing; Equipment testing; Integrated circuit testing; Integration testing; Mixed signal integrated circuits; Reconfigurable hardware; Semiconductor device manufacture; System-on-chip; Timing circuits; VLSI circuits; Automatic test equipment; Circuit testing; Fabricated chips; Fault coverages; Hybrid techniques; Reconfigurable; Test pattern generations; Very-large-scale integration circuits; Built-in self test

The optimisation of combined built-in self-test (BIST) and automatic test equipment (ATE) is desirable for complex fabricated chip testing to meet the high fault coverage while preserving acceptable costs. The fault coverage of BIST and ATE plays a significant role, because it can affect the area ov...