Microstructural evolution of oxygen incorporated CdTe thin films deposited by close-spaced sublimation

• Main Authors: Harif M.N., Rahman K.S., Doroody C., Rosly H.N., Isah M., Alghoul M.A., Misran H., Amin N.
• Other Authors: 22634024000
• Format: Article
• Published: Elsevier B.V. 2023

Annealing; Argon; Cadmium telluride; Carrier concentration; Energy gap; Grain size and shape; II-VI semiconductors; Morphology; Optical properties; Oxygen; Scanning electron microscopy; Sublimation; Surface morphology; Thin films; X ray diffraction; Argon ambient; Argon/O2 ambient; Cadmium telluride...