Microstructural evolution of oxygen incorporated CdTe thin films deposited by close-spaced sublimation
Annealing; Argon; Cadmium telluride; Carrier concentration; Energy gap; Grain size and shape; II-VI semiconductors; Morphology; Optical properties; Oxygen; Scanning electron microscopy; Sublimation; Surface morphology; Thin films; X ray diffraction; Argon ambient; Argon/O2 ambient; Cadmium telluride...
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Main Authors: | Harif M.N., Rahman K.S., Doroody C., Rosly H.N., Isah M., Alghoul M.A., Misran H., Amin N. |
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Other Authors: | 22634024000 |
Format: | Article |
Published: |
Elsevier B.V.
2023
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