Microstructural evolution of oxygen incorporated CdTe thin films deposited by close-spaced sublimation
Annealing; Argon; Cadmium telluride; Carrier concentration; Energy gap; Grain size and shape; II-VI semiconductors; Morphology; Optical properties; Oxygen; Scanning electron microscopy; Sublimation; Surface morphology; Thin films; X ray diffraction; Argon ambient; Argon/O2 ambient; Cadmium telluride...
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| Main Authors: | , , , , , , , |
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Elsevier B.V.
2023
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