Control factors optimization on threshold voltage and leakage current in 22 nm NMOS transistor using Taguchi method

In this article, Taguchi method was used to optimize the control factor in obtaining the optimal value which is also known as response characteristics, where the threshold voltage (Vth) and leakage current (Ileak) for NMOS transistor with a gate length of 22 nm is taken into account. The NMOS transi...

Full description

Saved in:
Bibliographic Details
Main Authors: Afifah Maheran A.H., Menon P.S., Ahmad I., Salehuddin F., Mohd A.S., Noor Z.A., Elgomati H.A.
Other Authors: 36570222300
Format: Article
Published: Universiti Teknikal Malaysia Melaka 2023
Tags: Add Tag
No Tags, Be the first to tag this record!