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Characterization of RF substrate noise isolation and bandgap reference voltage of 0.18 um CMOS

THS TK7874.75.I92 2005

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Main Author: Izahan Syemylona Ishak
Format: text::Thesis
Language:English
Published: 2023
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spelling my.uniten.dspace-195342023-05-04T13:02:32Z Characterization of RF substrate noise isolation and bandgap reference voltage of 0.18 um CMOS Izahan Syemylona Ishak THS TK7874.75.I92 2005 2023-05-03T13:36:43Z 2023-05-03T13:36:43Z 2005-03 Resource Types::text::Thesis https://irepository.uniten.edu.my/handle/123456789/19534 en application/pdf
institution Universiti Tenaga Nasional
building UNITEN Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Tenaga Nasional
content_source UNITEN Institutional Repository
url_provider http://dspace.uniten.edu.my/
language English
description THS TK7874.75.I92 2005
format Resource Types::text::Thesis
author Izahan Syemylona Ishak
spellingShingle Izahan Syemylona Ishak
Characterization of RF substrate noise isolation and bandgap reference voltage of 0.18 um CMOS
author_facet Izahan Syemylona Ishak
author_sort Izahan Syemylona Ishak
title Characterization of RF substrate noise isolation and bandgap reference voltage of 0.18 um CMOS
title_short Characterization of RF substrate noise isolation and bandgap reference voltage of 0.18 um CMOS
title_full Characterization of RF substrate noise isolation and bandgap reference voltage of 0.18 um CMOS
title_fullStr Characterization of RF substrate noise isolation and bandgap reference voltage of 0.18 um CMOS
title_full_unstemmed Characterization of RF substrate noise isolation and bandgap reference voltage of 0.18 um CMOS
title_sort characterization of rf substrate noise isolation and bandgap reference voltage of 0.18 um cmos
publishDate 2023
_version_ 1806423373921648640
score 13.211869

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