Holdings: Organic thin film transistor memories with carbon nanodots fabricated by focused ion beam chemical vapor deposition

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Bibliographic Details
Main Authors:	Ruslinda, Abd. Rahim, Uda, Hashim, Prof. Dr., Fukuda, Hisashi, Tada, Yoshihiro, Wainai, Noriyuki, Uesugi, Katsuhiro, Shimoyama, Yuhei
Format:	Working Paper
Language:	English
Published:	American Institute of Physics 2010
Subjects:	Atomic force microscopy Carbon Focused ion beam Nanocrystal Organic thin film transistor Raman spectroscopy International Conference on Nanoscience and Nanotechnology (ICONN)
Online Access:	http://dspace.unimap.edu.my/xmlui/handle/123456789/8637
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