Performance evaluation of SRAM-PUF based on 7-nm, 10-nm and 14-nm FinFET technology nodes

• Main Authors: Mohd Syafiq, Mispan, Aiman Zakwan, Jidin, Hafez, Sarkawi, Haslinah, Mohd Nasir
• Other Authors: [e-mail]
• Format: Article
• Language: English
• Published: Universiti Malaysia Perlis (UniMAP) 2022
• Subjects: Physical Unclonable Function; FinFET; Process variations; Hardware security
• Online Access: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/74877

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