Comments: Techniques in Integrated Circuit (IC) failure analysis

Organized by ELectron Microscopy Society of Malaysia (EMSM), 13th - 15th December 2004 at Palm Garden Hotel, Putrajaya.

Saved in:

Bibliographic Details
Main Authors:	Zul Azhar, Zahid Jamal, Assoc. Prof. Dr., Sanna, Taking
Format:	Working Paper
Language:	English
Published:	ELectron Microscopy Society of Malaysia (EMSM) 2009
Subjects:	Failure analysis Integrated circuits Microelectronics Reliability (Engineering)
Online Access:	http://dspace.unimap.edu.my/xmlui/handle/123456789/6362
Tags:	Add Tag No Tags, Be the first to tag this record!

Be the first to leave a comment!