Description: Temperature and energy dependence of diffusion in Solid - Effect of Diffusion Coefficient and Junction Depth

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Bibliographic Details
Main Author:	Nur Ruzana Bohari
Other Authors:	Mohd Hafiz Ismail (Advisor)
Format:	Learning Object
Language:	English
Published:	Universiti Malaysia Perlis 2008
Subjects:	Diffusion Semiconductors Negative metal oxide semiconductors (NMOS) Integrated circuits Silicon
Online Access:	http://dspace.unimap.edu.my/xmlui/handle/123456789/1991
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Summary:	Access is limited to UniMAP community.