Simulation, fabrication and electrical characterization of p-Si capacitor design structure

Technology CAD (TCAD) refers to the use of computer simulation to model semiconductor processing and device operation. TCAD has two major functions which are process simulation and device simulation. It performs the semiconductor process simulation function and the device simulation function by taki...

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Main Author: Cheryl She Siew Yuet
Other Authors: Noraini Othman (Advisor)
Format: Learning Object
Language:English
Published: Universiti Malaysia Perlis 2008
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Online Access:http://dspace.unimap.edu.my/xmlui/handle/123456789/1954
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spelling my.unimap-19542008-10-15T03:37:20Z Simulation, fabrication and electrical characterization of p-Si capacitor design structure Cheryl She Siew Yuet Noraini Othman (Advisor) Semiconductor -- Design and construction Computer-aided design Computer simulation Silicon p-Si capacitors Capacitors Technology CAD (TCAD) refers to the use of computer simulation to model semiconductor processing and device operation. TCAD has two major functions which are process simulation and device simulation. It performs the semiconductor process simulation function and the device simulation function by taking the description of the capacitor input to simulate the fabrication process and device behavior before the actual silicon is made. The objectives and scopes of this work are to demonstrate the application of Synopsys TCAD Tools in developing p-Si capacitors fabrication process. In developing the p-Si capacitor, there are few areas to focus such as simulation process, fabrication specification and electrical characterization of the device. This Final Year Project report illustrates the use of Synopsis Taurus TCAD to develop process simulation (TSUPREM-4) and device simulation (MEDICI) to obtain the parameter used for fabrication process. The device will fabricated using standard semiconductor processing technique. The masks for fabrication are designed in AutoCAD tool and print on high quality of transparency with aid of photo plotting technique. The final product of the fabricated device will be gone through an electrical characterization testing by Semiconductor Parametric Analyzer to get the CV curve. Simulation and electrical characterization result will be compare with 10 µm and 100 µm gate area size and there are percentage error occur. The percentage error of oxide thickness (0.238 %), voltage breakdown is less than 9 %, threshold voltage 0% and oxide capacitance is around 20%. As conclusion, the objective of this work was achieved where all the parts were successfully conducted and obtain the result. Also consist of recommendation to enhance the project such as provide in the equipment which also can characterize high frequency capacitance. 2008-09-05T02:33:29Z 2008-09-05T02:33:29Z 2008-03 Learning Object http://hdl.handle.net/123456789/1954 en Universiti Malaysia Perlis School of Microelectronic Engineering
institution Universiti Malaysia Perlis
building UniMAP Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaysia Perlis
content_source UniMAP Library Digital Repository
url_provider http://dspace.unimap.edu.my/
language English
topic Semiconductor -- Design and construction
Computer-aided design
Computer simulation
Silicon
p-Si capacitors
Capacitors
spellingShingle Semiconductor -- Design and construction
Computer-aided design
Computer simulation
Silicon
p-Si capacitors
Capacitors
Cheryl She Siew Yuet
Simulation, fabrication and electrical characterization of p-Si capacitor design structure
description Technology CAD (TCAD) refers to the use of computer simulation to model semiconductor processing and device operation. TCAD has two major functions which are process simulation and device simulation. It performs the semiconductor process simulation function and the device simulation function by taking the description of the capacitor input to simulate the fabrication process and device behavior before the actual silicon is made. The objectives and scopes of this work are to demonstrate the application of Synopsys TCAD Tools in developing p-Si capacitors fabrication process. In developing the p-Si capacitor, there are few areas to focus such as simulation process, fabrication specification and electrical characterization of the device. This Final Year Project report illustrates the use of Synopsis Taurus TCAD to develop process simulation (TSUPREM-4) and device simulation (MEDICI) to obtain the parameter used for fabrication process. The device will fabricated using standard semiconductor processing technique. The masks for fabrication are designed in AutoCAD tool and print on high quality of transparency with aid of photo plotting technique. The final product of the fabricated device will be gone through an electrical characterization testing by Semiconductor Parametric Analyzer to get the CV curve. Simulation and electrical characterization result will be compare with 10 µm and 100 µm gate area size and there are percentage error occur. The percentage error of oxide thickness (0.238 %), voltage breakdown is less than 9 %, threshold voltage 0% and oxide capacitance is around 20%. As conclusion, the objective of this work was achieved where all the parts were successfully conducted and obtain the result. Also consist of recommendation to enhance the project such as provide in the equipment which also can characterize high frequency capacitance.
author2 Noraini Othman (Advisor)
author_facet Noraini Othman (Advisor)
Cheryl She Siew Yuet
format Learning Object
author Cheryl She Siew Yuet
author_sort Cheryl She Siew Yuet
title Simulation, fabrication and electrical characterization of p-Si capacitor design structure
title_short Simulation, fabrication and electrical characterization of p-Si capacitor design structure
title_full Simulation, fabrication and electrical characterization of p-Si capacitor design structure
title_fullStr Simulation, fabrication and electrical characterization of p-Si capacitor design structure
title_full_unstemmed Simulation, fabrication and electrical characterization of p-Si capacitor design structure
title_sort simulation, fabrication and electrical characterization of p-si capacitor design structure
publisher Universiti Malaysia Perlis
publishDate 2008
url http://dspace.unimap.edu.my/xmlui/handle/123456789/1954
_version_ 1643787503674589184
score 13.214268