Impact of nucleation temperature on growth uniformity of GaN on 4-inch dome-patterned sapphire substrate
Considerable demands for energy-efficient visible LEDs nowadays have led to a pressing need for high-quality GaN/sapphire templates with large diameters. One of the major challenges to achieve the goal is to obtain good growth uniformity across the entire area of the templates. This paper attempts t...
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my.um.eprints.457242024-11-11T03:57:46Z http://eprints.um.edu.my/45724/ Impact of nucleation temperature on growth uniformity of GaN on 4-inch dome-patterned sapphire substrate Azmi, Nor Syafiqah Mazlan, Muhammad Naim Taib, Mohd Ikram Md Ahmad, Mohd Anas Samsuri, Mohd Shahrul Nizam Mansor, Marwan Hisyam, Muhammad Iznul Abu Bakar, Ahmad Shuhaimi Zainal, Norzaini Q Science (General) QC Physics Considerable demands for energy-efficient visible LEDs nowadays have led to a pressing need for high-quality GaN/sapphire templates with large diameters. One of the major challenges to achieve the goal is to obtain good growth uniformity across the entire area of the templates. This paper attempts to improve the growth uniformity for GaN layers on 4-inch dome-patterned sapphire substrate (DPSS) by optimising the GaN nucleation temperature. Here, the nucleation temperature was varied at 520 degrees C, 550 degrees C, 570 degrees C, 590 degrees C, and 620 degrees C. In comparison to the case with 520 degrees C and 620 degrees C nucleation, the threading dislocation density (TDD) at three different positions (i.e. centre, half-radius on the right side and half-radius on the left side) of the GaN layers grown with 550 degrees C-590 degrees C nucleation was relatively lower and the result was consistent among the positions. Meanwhile, the average in-plane strain was higher for these GaN layers compared to the case with 520 degrees C and 620 degrees C nucleation. This might be associated with the improvement of the crystalline structure of the layers. Moreover, for the GaN layers with the nucleation of 520 degrees C-590 degrees C, the surface was atomically smoother and showed step-flow characteristics at the three positions. It can be suggested that the nucleation at 520 degrees C-590 degrees C favoured the growth on the trenches rather than the sidewalls, thereby suppressing multiple growth orientations. Subsequently, an InGaN blue LED was grown on GaN layer with the optimised nucleation temperature. It was found that the electrical and optical characteristics of different LED chips are fairly uniform. Elsevier 2024-04 Article PeerReviewed Azmi, Nor Syafiqah and Mazlan, Muhammad Naim and Taib, Mohd Ikram Md and Ahmad, Mohd Anas and Samsuri, Mohd Shahrul Nizam and Mansor, Marwan and Hisyam, Muhammad Iznul and Abu Bakar, Ahmad Shuhaimi and Zainal, Norzaini (2024) Impact of nucleation temperature on growth uniformity of GaN on 4-inch dome-patterned sapphire substrate. Materials Science in Semiconductor Processing, 173. p. 108177. ISSN 1369-8001, DOI https://doi.org/10.1016/j.mssp.2024.108177 <https://doi.org/10.1016/j.mssp.2024.108177>. https://doi.org/10.1016/j.mssp.2024.108177 10.1016/j.mssp.2024.108177 |
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Q Science (General) QC Physics Azmi, Nor Syafiqah Mazlan, Muhammad Naim Taib, Mohd Ikram Md Ahmad, Mohd Anas Samsuri, Mohd Shahrul Nizam Mansor, Marwan Hisyam, Muhammad Iznul Abu Bakar, Ahmad Shuhaimi Zainal, Norzaini Impact of nucleation temperature on growth uniformity of GaN on 4-inch dome-patterned sapphire substrate |
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Considerable demands for energy-efficient visible LEDs nowadays have led to a pressing need for high-quality GaN/sapphire templates with large diameters. One of the major challenges to achieve the goal is to obtain good growth uniformity across the entire area of the templates. This paper attempts to improve the growth uniformity for GaN layers on 4-inch dome-patterned sapphire substrate (DPSS) by optimising the GaN nucleation temperature. Here, the nucleation temperature was varied at 520 degrees C, 550 degrees C, 570 degrees C, 590 degrees C, and 620 degrees C. In comparison to the case with 520 degrees C and 620 degrees C nucleation, the threading dislocation density (TDD) at three different positions (i.e. centre, half-radius on the right side and half-radius on the left side) of the GaN layers grown with 550 degrees C-590 degrees C nucleation was relatively lower and the result was consistent among the positions. Meanwhile, the average in-plane strain was higher for these GaN layers compared to the case with 520 degrees C and 620 degrees C nucleation. This might be associated with the improvement of the crystalline structure of the layers. Moreover, for the GaN layers with the nucleation of 520 degrees C-590 degrees C, the surface was atomically smoother and showed step-flow characteristics at the three positions. It can be suggested that the nucleation at 520 degrees C-590 degrees C favoured the growth on the trenches rather than the sidewalls, thereby suppressing multiple growth orientations. Subsequently, an InGaN blue LED was grown on GaN layer with the optimised nucleation temperature. It was found that the electrical and optical characteristics of different LED chips are fairly uniform. |
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Azmi, Nor Syafiqah Mazlan, Muhammad Naim Taib, Mohd Ikram Md Ahmad, Mohd Anas Samsuri, Mohd Shahrul Nizam Mansor, Marwan Hisyam, Muhammad Iznul Abu Bakar, Ahmad Shuhaimi Zainal, Norzaini |
author_facet |
Azmi, Nor Syafiqah Mazlan, Muhammad Naim Taib, Mohd Ikram Md Ahmad, Mohd Anas Samsuri, Mohd Shahrul Nizam Mansor, Marwan Hisyam, Muhammad Iznul Abu Bakar, Ahmad Shuhaimi Zainal, Norzaini |
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Azmi, Nor Syafiqah |
title |
Impact of nucleation temperature on growth uniformity of GaN on 4-inch dome-patterned sapphire substrate |
title_short |
Impact of nucleation temperature on growth uniformity of GaN on 4-inch dome-patterned sapphire substrate |
title_full |
Impact of nucleation temperature on growth uniformity of GaN on 4-inch dome-patterned sapphire substrate |
title_fullStr |
Impact of nucleation temperature on growth uniformity of GaN on 4-inch dome-patterned sapphire substrate |
title_full_unstemmed |
Impact of nucleation temperature on growth uniformity of GaN on 4-inch dome-patterned sapphire substrate |
title_sort |
impact of nucleation temperature on growth uniformity of gan on 4-inch dome-patterned sapphire substrate |
publisher |
Elsevier |
publishDate |
2024 |
url |
http://eprints.um.edu.my/45724/ https://doi.org/10.1016/j.mssp.2024.108177 |
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1816130449727029248 |
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13.214268 |