Influence of argon/nitrogen sputtering gas and molybdenum/titanium seed layer on aluminium nitride ⟨100⟩ thin film growth using ceramic target

Aluminium nitride (AlN) can be sputter-deposited onto a substrate to form polycrystalline or single crystal AlN thin film layer. Highly crystalline AlN in ⟨100⟩ orientation has found its application in high-frequency acoustic wave resonators. The research work to investigate AlN ⟨100⟩ crystal growth...

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Main Authors: Samad, Muhammad Izzuddin Abd, Badrudin, Syazwani Izrah, Ponnuthurai, Darven Raj, Mansor, Marwan, Nayan, Nafarizal, Abu Bakar, Ahmad Shuhaimi, Latif, Rhonira
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Published: Elsevier 2024
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Online Access:http://eprints.um.edu.my/44756/
https://doi.org/10.1016/j.jmrt.2024.01.286
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spelling my.um.eprints.447562024-11-15T07:46:03Z http://eprints.um.edu.my/44756/ Influence of argon/nitrogen sputtering gas and molybdenum/titanium seed layer on aluminium nitride ⟨100⟩ thin film growth using ceramic target Samad, Muhammad Izzuddin Abd Badrudin, Syazwani Izrah Ponnuthurai, Darven Raj Mansor, Marwan Nayan, Nafarizal Abu Bakar, Ahmad Shuhaimi Latif, Rhonira QC Physics Aluminium nitride (AlN) can be sputter-deposited onto a substrate to form polycrystalline or single crystal AlN thin film layer. Highly crystalline AlN in ⟨100⟩ orientation has found its application in high-frequency acoustic wave resonators. The research work to investigate AlN ⟨100⟩ crystal growth in magnetron sputtering deposition using AlN ceramic target is rarely studied. In our work, a comprehensive study on the influence of argon only/argon plus purified nitrogen/argon plus unpurified nitrogen sputtering gas, a variation of argon to purified nitrogen fraction of 1:1, 1:2 and 1:4 and affixing silicon (Si), molybdenum (Mo) or titanium (Ti) underneath/seed layer on the crystal growth of AlN ⟨100⟩ is presented. The addition of nitrogen gas, either purified or unpurified has reduced the growth rate of AlN and introduced more oxygen into the sputtering chamber, contaminating AlN with alumina crystals. Although the Al–O bond in AlN increases, the sputter-deposited AlN ⟨100⟩ crystal in purified nitrogen of equivalent ratio with argon has improved significantly compared to argon only sputtering gas. The AlN grows into amorphous state with smooth surface as the portion for purified nitrogen becomes double/quadraple compared to argon. High quality of AlN ⟨100⟩ thin film layer is achieved by inserting purified nitrogen into argon of ratio not more than 1:1.The incredibly small atomic mismatch of 1.2 between AlN ⟨100⟩ and Mo is attained but the surface is contaminated with molybdenum oxides. The smallest AlN surface roughness with moderate lattice mismatch can be attained by employing Ti seed layer. © 2024 The Author(s) Elsevier 2024 Article PeerReviewed Samad, Muhammad Izzuddin Abd and Badrudin, Syazwani Izrah and Ponnuthurai, Darven Raj and Mansor, Marwan and Nayan, Nafarizal and Abu Bakar, Ahmad Shuhaimi and Latif, Rhonira (2024) Influence of argon/nitrogen sputtering gas and molybdenum/titanium seed layer on aluminium nitride ⟨100⟩ thin film growth using ceramic target. Journal of Materials Research and Technology-JMR&T, 29. pp. 2248-2257. ISSN 2238-7854, DOI https://doi.org/10.1016/j.jmrt.2024.01.286 <https://doi.org/10.1016/j.jmrt.2024.01.286>. https://doi.org/10.1016/j.jmrt.2024.01.286 10.1016/j.jmrt.2024.01.286
institution Universiti Malaya
building UM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaya
content_source UM Research Repository
url_provider http://eprints.um.edu.my/
topic QC Physics
spellingShingle QC Physics
Samad, Muhammad Izzuddin Abd
Badrudin, Syazwani Izrah
Ponnuthurai, Darven Raj
Mansor, Marwan
Nayan, Nafarizal
Abu Bakar, Ahmad Shuhaimi
Latif, Rhonira
Influence of argon/nitrogen sputtering gas and molybdenum/titanium seed layer on aluminium nitride ⟨100⟩ thin film growth using ceramic target
description Aluminium nitride (AlN) can be sputter-deposited onto a substrate to form polycrystalline or single crystal AlN thin film layer. Highly crystalline AlN in ⟨100⟩ orientation has found its application in high-frequency acoustic wave resonators. The research work to investigate AlN ⟨100⟩ crystal growth in magnetron sputtering deposition using AlN ceramic target is rarely studied. In our work, a comprehensive study on the influence of argon only/argon plus purified nitrogen/argon plus unpurified nitrogen sputtering gas, a variation of argon to purified nitrogen fraction of 1:1, 1:2 and 1:4 and affixing silicon (Si), molybdenum (Mo) or titanium (Ti) underneath/seed layer on the crystal growth of AlN ⟨100⟩ is presented. The addition of nitrogen gas, either purified or unpurified has reduced the growth rate of AlN and introduced more oxygen into the sputtering chamber, contaminating AlN with alumina crystals. Although the Al–O bond in AlN increases, the sputter-deposited AlN ⟨100⟩ crystal in purified nitrogen of equivalent ratio with argon has improved significantly compared to argon only sputtering gas. The AlN grows into amorphous state with smooth surface as the portion for purified nitrogen becomes double/quadraple compared to argon. High quality of AlN ⟨100⟩ thin film layer is achieved by inserting purified nitrogen into argon of ratio not more than 1:1.The incredibly small atomic mismatch of 1.2 between AlN ⟨100⟩ and Mo is attained but the surface is contaminated with molybdenum oxides. The smallest AlN surface roughness with moderate lattice mismatch can be attained by employing Ti seed layer. © 2024 The Author(s)
format Article
author Samad, Muhammad Izzuddin Abd
Badrudin, Syazwani Izrah
Ponnuthurai, Darven Raj
Mansor, Marwan
Nayan, Nafarizal
Abu Bakar, Ahmad Shuhaimi
Latif, Rhonira
author_facet Samad, Muhammad Izzuddin Abd
Badrudin, Syazwani Izrah
Ponnuthurai, Darven Raj
Mansor, Marwan
Nayan, Nafarizal
Abu Bakar, Ahmad Shuhaimi
Latif, Rhonira
author_sort Samad, Muhammad Izzuddin Abd
title Influence of argon/nitrogen sputtering gas and molybdenum/titanium seed layer on aluminium nitride ⟨100⟩ thin film growth using ceramic target
title_short Influence of argon/nitrogen sputtering gas and molybdenum/titanium seed layer on aluminium nitride ⟨100⟩ thin film growth using ceramic target
title_full Influence of argon/nitrogen sputtering gas and molybdenum/titanium seed layer on aluminium nitride ⟨100⟩ thin film growth using ceramic target
title_fullStr Influence of argon/nitrogen sputtering gas and molybdenum/titanium seed layer on aluminium nitride ⟨100⟩ thin film growth using ceramic target
title_full_unstemmed Influence of argon/nitrogen sputtering gas and molybdenum/titanium seed layer on aluminium nitride ⟨100⟩ thin film growth using ceramic target
title_sort influence of argon/nitrogen sputtering gas and molybdenum/titanium seed layer on aluminium nitride ⟨100⟩ thin film growth using ceramic target
publisher Elsevier
publishDate 2024
url http://eprints.um.edu.my/44756/
https://doi.org/10.1016/j.jmrt.2024.01.286
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score 13.214268