Review-electrochemical migration in electronic materials: Factors affecting the mechanism and recent strategies for inhibition

• Main Authors: Lee, Ee Lynn, Goh, Yi Sing, Haseeb, A. S. M. A., Wong, Yew Hoong, Sabri, Mohd Faizul Mohd, Low, Boon Yew
• Format: Article
• Published: Electrochemical Society 2023
• Subjects: T Technology (General); TJ Mechanical engineering and machinery
• Online Access: http://eprints.um.edu.my/38710/

Electrochemical migration (ECM) is one of the serious failure modes encountered in electronic devices due to the electrochemical reactions triggered by the presence of moisture and bias voltage, leading to the growth of dendrites and short circuits. The classical ECM mechanism consists of four conse...