Properties of thermally oxidized and nitrided Zr-oxynitride thin film on 4H–SiC in diluted N2O ambient
A systematic investigation on the structural, chemical, and electrical properties of thermally oxidized and nitrided sputtered Zr thin film in various N2O ambient (10–100%) at 500 °C for 15 min to form Zr-oxynitride on 4H–SiC substrate has been carried out. The chemical composition, depth profile an...
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| Main Authors: | , |
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| Format: | Article |
| Published: |
Elsevier
2012
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| Online Access: | http://eprints.um.edu.my/13002/ http://www.sciencedirect.com/science/article/pii/S0254058412006839 http://dx.doi.org/10.1016/j.matchemphys.2012.07.035 |
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