Noise sources extraction for conducted emission modeling of IC’s using IBIS models
The proper functioning of an Integrated Circuit (IC) in an impeding Electromagnetic environment has always been a major concern. Electromagnetic Interference (EMI) can cause an IC to malfunction or give erroneous results. This becomes even a bigger concern for IC’s that are used in automotive ind...
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Main Authors: | , , |
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Format: | Conference or Workshop Item |
Language: | English English |
Published: |
IEEE
2021
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Online Access: | http://irep.iium.edu.my/95127/1/95127_Noise%20sources%20extraction%20for%20conducted%20emission%20modeling.pdf http://irep.iium.edu.my/95127/7/95127_Noise%20sources%20extraction%20for%20conducted%20emission%20modeling_SCOPUS.pdf http://irep.iium.edu.my/95127/ https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9467148 |
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http://irep.iium.edu.my/95127/1/95127_Noise%20sources%20extraction%20for%20conducted%20emission%20modeling.pdfhttp://irep.iium.edu.my/95127/7/95127_Noise%20sources%20extraction%20for%20conducted%20emission%20modeling_SCOPUS.pdf
http://irep.iium.edu.my/95127/
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9467148