Noise sources extraction for conducted emission modeling of IC’s using IBIS models
The proper functioning of an Integrated Circuit (IC) in an impeding Electromagnetic environment has always been a major concern. Electromagnetic Interference (EMI) can cause an IC to malfunction or give erroneous results. This becomes even a bigger concern for IC’s that are used in automotive ind...
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my.iium.irep.951272021-12-23T07:16:02Z http://irep.iium.edu.my/95127/ Noise sources extraction for conducted emission modeling of IC’s using IBIS models Baba, Tamana Che Mustapha, Nurul Arfah Hasbullah, Nurul Fadzlin TA174 Engineering design TK7800 Electronics. Computer engineering. Computer hardware. Photoelectronic devices TK7885 Computer engineering The proper functioning of an Integrated Circuit (IC) in an impeding Electromagnetic environment has always been a major concern. Electromagnetic Interference (EMI) can cause an IC to malfunction or give erroneous results. This becomes even a bigger concern for IC’s that are used in automotive industry. Automotive industry in particular, the smart vehicle, is facing design challenges such as susceptibility towards Electromagnetic Interference (EMI). The growing numbers of IC’s on the electronic modules in smart automotive industry creates demand on Electromagnetic Compatibility (EMC) compliance. This EMC is driven by preventing Electromagnetic Interference (EMI) malfunctions within a vehicle. Failure to prevent this could result in fatal accidents. This paper introduces the basic concepts related to the Electromagnetic Compatibility (EMC) of integrated circuits (IC’s). An overview of methods to evaluate EMC of an IC’s has been provided and a methodology to extract noise sources using IBIS model of IC’s is introduced in this paper. Cosimulations are carried out between ANSYS HFSS and Agilent ADS. Noise sources for conducted emission modelling have been extracted. IEEE 2021-07-01 Conference or Workshop Item PeerReviewed application/pdf en http://irep.iium.edu.my/95127/1/95127_Noise%20sources%20extraction%20for%20conducted%20emission%20modeling.pdf application/pdf en http://irep.iium.edu.my/95127/7/95127_Noise%20sources%20extraction%20for%20conducted%20emission%20modeling_SCOPUS.pdf Baba, Tamana and Che Mustapha, Nurul Arfah and Hasbullah, Nurul Fadzlin (2021) Noise sources extraction for conducted emission modeling of IC’s using IBIS models. In: 2021 8th International Conference on Computer and Communication Engineering (ICCCE), Kuala Lumpur, Malaysia. https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9467148 10.1109/ICCCE50029.2021.9467148 |
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TA174 Engineering design TK7800 Electronics. Computer engineering. Computer hardware. Photoelectronic devices TK7885 Computer engineering Baba, Tamana Che Mustapha, Nurul Arfah Hasbullah, Nurul Fadzlin Noise sources extraction for conducted emission modeling of IC’s using IBIS models |
description |
The proper functioning of an Integrated Circuit (IC) in an impeding Electromagnetic environment has always
been a major concern. Electromagnetic Interference (EMI) can cause an IC to malfunction or give erroneous results. This
becomes even a bigger concern for IC’s that are used in
automotive industry. Automotive industry in particular, the
smart vehicle, is facing design challenges such as susceptibility towards Electromagnetic Interference (EMI). The growing numbers of IC’s on the electronic modules in smart automotive industry creates demand on Electromagnetic Compatibility (EMC) compliance. This EMC is driven by preventing Electromagnetic Interference (EMI) malfunctions within a vehicle. Failure to prevent this could result in fatal accidents. This paper introduces the basic concepts related to the Electromagnetic Compatibility (EMC) of integrated circuits (IC’s). An overview of methods to evaluate EMC of an IC’s has been provided and a methodology to extract noise sources using IBIS model of IC’s is introduced in this paper. Cosimulations are carried out between ANSYS HFSS and Agilent ADS. Noise sources for conducted emission modelling have been extracted. |
format |
Conference or Workshop Item |
author |
Baba, Tamana Che Mustapha, Nurul Arfah Hasbullah, Nurul Fadzlin |
author_facet |
Baba, Tamana Che Mustapha, Nurul Arfah Hasbullah, Nurul Fadzlin |
author_sort |
Baba, Tamana |
title |
Noise sources extraction for conducted emission modeling of IC’s using IBIS models |
title_short |
Noise sources extraction for conducted emission modeling of IC’s using IBIS models |
title_full |
Noise sources extraction for conducted emission modeling of IC’s using IBIS models |
title_fullStr |
Noise sources extraction for conducted emission modeling of IC’s using IBIS models |
title_full_unstemmed |
Noise sources extraction for conducted emission modeling of IC’s using IBIS models |
title_sort |
noise sources extraction for conducted emission modeling of ic’s using ibis models |
publisher |
IEEE |
publishDate |
2021 |
url |
http://irep.iium.edu.my/95127/1/95127_Noise%20sources%20extraction%20for%20conducted%20emission%20modeling.pdf http://irep.iium.edu.my/95127/7/95127_Noise%20sources%20extraction%20for%20conducted%20emission%20modeling_SCOPUS.pdf http://irep.iium.edu.my/95127/ https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9467148 |
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1720436674618458112 |
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13.160551 |