Noise sources extraction for conducted emission modeling of IC’s using IBIS models

• Main Authors: Baba, Tamana, Che Mustapha, Nurul Arfah, Hasbullah, Nurul Fadzlin
• Format: Conference or Workshop Item
• Language: English; English
• Published: IEEE 2021
• Subjects: TA174 Engineering design; TK7800 Electronics. Computer engineering. Computer hardware. Photoelectronic devices; TK7885 Computer engineering
• Online Access: http://irep.iium.edu.my/95127/1/95127_Noise%20sources%20extraction%20for%20conducted%20emission%20modeling.pdf; http://irep.iium.edu.my/95127/7/95127_Noise%20sources%20extraction%20for%20conducted%20emission%20modeling_SCOPUS.pdf; http://irep.iium.edu.my/95127/; https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9467148

The proper functioning of an Integrated Circuit (IC) in an impeding Electromagnetic environment has always been a major concern. Electromagnetic Interference (EMI) can cause an IC to malfunction or give erroneous results. This becomes even a bigger concern for IC’s that are used in automotive ind...