Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes

• Main Authors: Mahmood, Iskandar Al-Thani, Moheimani, S.O. Reza
• Format: Conference or Workshop Item
• Language: English
• Published: 2010
• Subjects: Q Science (General); TJ212 Control engineering
• Online Access: http://irep.iium.edu.my/5304/1/Spiral_scanning_-_An_alternative_to_conventional_raster_scanning_in_high-speed_Scanning_Probe_Microscopes.pdf; http://irep.iium.edu.my/5304/; http://a2c2.org/conferences/acc2010/

A spiral scanning method for high-speed Atomic Force Microscopy (AFM) is described in this paper. In this method, the sample is scanned in a spiral pattern instead of the conventional raster pattern. A spiral scan can be produced by applying single frequency cosine and sine signals with slowly varyi...