A case study on the effectiveness of Wafer-Ring Multi-sites test handler to improve of Production Output.
The conventional method allows testing of only one chip at a time (single-site testing). However, due to advancements in testing procedures, current test technologies are able to conduct dual-sites testing, quad-sites testing, octal-sites testing, 16-sites testing, 32-sites testing, and so on. In li...
Saved in:
| Main Author: | |
|---|---|
| Format: | Journal |
| Language: | English |
| Published: |
2016
|
| Subjects: | |
| Online Access: | http://ur.aeu.edu.my/498/1/A%20case%20study%20on%20the%20effectiveness%20of%20Wafer-Ring%20Multi-sites%20test%20handler%20to%20improve%20of%20Production%20Output.pdf http://ur.aeu.edu.my/498/ |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Summary: | The conventional method allows testing of only one chip at a time (single-site testing). However, due to advancements in testing procedures, current test technologies are able to conduct dual-sites testing, quad-sites testing, octal-sites testing, 16-sites testing, 32-sites testing, and so on. In line with this, the multi-site testing approach is a method that increases the number of chips that can be tested in a single touch-up. This method allows more chips to be tested per hour, thus improving the testing throughput. In this research the author take the initiative to develop a multi-sites throughput model to investigate the effectiveness of multi-site testing approach on improving the testing throughput. In the case study, five multi-site configurations were applied. These configurations were single-site, quad-sites, octal-sites, ×16-sites, and ×32-sites. A hypothesis was analyzed by using one-way ANOVA and Post Hoc Test.
Index Terms— multi-site, test handler, semiconductor testing, multi-sites testing model. |
|---|