A case study on the effectiveness of Wafer-Ring Multi-sites test handler to improve of Production Output.
The conventional method allows testing of only one chip at a time (single-site testing). However, due to advancements in testing procedures, current test technologies are able to conduct dual-sites testing, quad-sites testing, octal-sites testing, 16-sites testing, 32-sites testing, and so on. In li...
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| Format: | Journal |
| Language: | English |
| Published: |
2016
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| Online Access: | http://ur.aeu.edu.my/498/1/A%20case%20study%20on%20the%20effectiveness%20of%20Wafer-Ring%20Multi-sites%20test%20handler%20to%20improve%20of%20Production%20Output.pdf http://ur.aeu.edu.my/498/ |
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