A framework to develop intelligent system for measuring product features using open CV technique

This research aims to propose an innovative framework using ISO14649 standard to detect defects in manufactured shaped objects or geometric surfaces of non-linear products of the CNC machine. The significant importance in order to recognize the potential to improve industry product quality inspectio...

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Main Authors: Saif, Yazid, Yusof, Yusri, Ahmed, Maznah lliyas, Pathan, Zohaib khan, Latif, Kamran, Abdul Kadir, Aini Zuhra
Format: Article
Language:English
Published: School of Technology Management & Logistics 2020
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Online Access:http://repo.uum.edu.my/28099/1/JTOM%2015%202%202020%2042%2051.pdf
http://repo.uum.edu.my/28099/
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spelling my.uum.repo.280992021-01-19T07:13:23Z http://repo.uum.edu.my/28099/ A framework to develop intelligent system for measuring product features using open CV technique Saif, Yazid Yusof, Yusri Ahmed, Maznah lliyas Pathan, Zohaib khan Latif, Kamran Abdul Kadir, Aini Zuhra QA75 Electronic computers. Computer science This research aims to propose an innovative framework using ISO14649 standard to detect defects in manufactured shaped objects or geometric surfaces of non-linear products of the CNC machine. The significant importance in order to recognize the potential to improve industry product quality inspection and encourage the waste of timing machines and product rejection. Open Computer Vision (Open CV) offers a smart, non-contact measurement and cost-effective technique to fulfill the requirements. The framework depends on the new technique of Open CV, which includes two parts: an intelligent selection of work-piece capturing the image for a particular inspection of the planar interfaces such as the hole, rectangular, pocket one, and the symmetric lighting model comparison approach for measurement of defects in the matched images. The contribution of this study is to build a structure in the computer vision method with a convolution neural network that predicts the classification of the feature for better accuracy and emphasizes the significant characteristics of the image processing technique coupled with experimental data on demanding image datasets and quality inspection measures. School of Technology Management & Logistics 2020 Article PeerReviewed application/pdf en http://repo.uum.edu.my/28099/1/JTOM%2015%202%202020%2042%2051.pdf Saif, Yazid and Yusof, Yusri and Ahmed, Maznah lliyas and Pathan, Zohaib khan and Latif, Kamran and Abdul Kadir, Aini Zuhra (2020) A framework to develop intelligent system for measuring product features using open CV technique. Journal of Technology and Operations Management, 15 (2). pp. 42-51. ISSN 2590-4175 http://e-journal.uum.edu.my/index.php/jtom
institution Universiti Utara Malaysia
building UUM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Utara Malaysia
content_source UUM Institutional Repository
url_provider http://repo.uum.edu.my/
language English
topic QA75 Electronic computers. Computer science
spellingShingle QA75 Electronic computers. Computer science
Saif, Yazid
Yusof, Yusri
Ahmed, Maznah lliyas
Pathan, Zohaib khan
Latif, Kamran
Abdul Kadir, Aini Zuhra
A framework to develop intelligent system for measuring product features using open CV technique
description This research aims to propose an innovative framework using ISO14649 standard to detect defects in manufactured shaped objects or geometric surfaces of non-linear products of the CNC machine. The significant importance in order to recognize the potential to improve industry product quality inspection and encourage the waste of timing machines and product rejection. Open Computer Vision (Open CV) offers a smart, non-contact measurement and cost-effective technique to fulfill the requirements. The framework depends on the new technique of Open CV, which includes two parts: an intelligent selection of work-piece capturing the image for a particular inspection of the planar interfaces such as the hole, rectangular, pocket one, and the symmetric lighting model comparison approach for measurement of defects in the matched images. The contribution of this study is to build a structure in the computer vision method with a convolution neural network that predicts the classification of the feature for better accuracy and emphasizes the significant characteristics of the image processing technique coupled with experimental data on demanding image datasets and quality inspection measures.
format Article
author Saif, Yazid
Yusof, Yusri
Ahmed, Maznah lliyas
Pathan, Zohaib khan
Latif, Kamran
Abdul Kadir, Aini Zuhra
author_facet Saif, Yazid
Yusof, Yusri
Ahmed, Maznah lliyas
Pathan, Zohaib khan
Latif, Kamran
Abdul Kadir, Aini Zuhra
author_sort Saif, Yazid
title A framework to develop intelligent system for measuring product features using open CV technique
title_short A framework to develop intelligent system for measuring product features using open CV technique
title_full A framework to develop intelligent system for measuring product features using open CV technique
title_fullStr A framework to develop intelligent system for measuring product features using open CV technique
title_full_unstemmed A framework to develop intelligent system for measuring product features using open CV technique
title_sort framework to develop intelligent system for measuring product features using open cv technique
publisher School of Technology Management & Logistics
publishDate 2020
url http://repo.uum.edu.my/28099/1/JTOM%2015%202%202020%2042%2051.pdf
http://repo.uum.edu.my/28099/
http://e-journal.uum.edu.my/index.php/jtom
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score 13.211869