An Improved Markov Random Field Design Approach For Digital Circuits: Introducing Fault-Tolerance With Higher Noise-Immunity For The Nano-Circuits As Compared To CMOS And MRF Designs Zoom See larger image (with zoom) Share your own customer images Publisher: learn how customers can search inside this book. An Improved Markov Random Field Design Approach For Digital Circuits: Introducing Fault-Tolerance With Higher Noise-Immunity For The Nano-Circuits As Compared To CMOS And MRF Designs

• Main Authors: Anwer, Janhanzeb, Hamid, Nor Hisham, Asirvadam , Vijanth Sagayan
• Format: Book
• Published: LAP LAMBERT Academic Publishing 2011
• Subjects: TK Electrical engineering. Electronics Nuclear engineering; QA75 Electronic computers. Computer science
• Online Access: http://www.amazon.com/Improved-Markov-Approach-Digital-Circuits/dp/images/3844332634; http://eprints.utp.edu.my/6904/

As the MOSFET dimensions scale down to nanoscale level, the reliability of circuits based on these devices decreases. Therefore, a mechanism has to be devised that can make the nanoscale systems perform reliably using unreliable circuit components. The solution is fault-tolerant circuit design. Mark...