A STUDY OF MRF CMOS CIRCUIT DESIGN IMPLEMENTATION

Shrinking devices to the smaller scale and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. One possible solution for this matter is to have a paradigm shift to a fault tolerant probabilistic framework. Probabilistic computing provides a new approach t...

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Bibliographic Details
Main Author: KERMANY, ATIEH RANIDAR
Format: Final Year Project
Language:English
Published: Universiti Teknologi Petronas 2008
Subjects:
Online Access:http://utpedia.utp.edu.my/7799/1/2008%20Bachelor%20-%20A%20Study%20Of%20MRF%20CMOS%20Circut%20Design%20Implementation.pdf
http://utpedia.utp.edu.my/7799/
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