Cover Image

Review of High Level Fault Modeling Approaches for Mixed-Signal Systems

In the modern analogue design, Transistor Level Fault Simulation (TLFS) plays the important part since every fault in the whole circuit has to be simulated at that level. Unfortunately, it is a very CPU intensive task even though it maintains the high accuracy. Therefore, High Level Fault Modeling (...

Full description

Saved in:
Bibliographic Details
Main Authors: Xia, Likun, Bell, Ian, Wilkinson, Antony
Format: Article
Published: Springer 2011
Subjects:
TK Electrical engineering. Electronics Nuclear engineering
Online Access:http://eprints.utp.edu.my/6145/1/fulltext.pdf
http://eprints.utp.edu.my/6145/
Tags: Add Tag
No Tags, Be the first to tag this record!
id my.utp.eprints.6145
record_format eprints
spelling my.utp.eprints.61452017-01-19T08:22:36Z Review of High Level Fault Modeling Approaches for Mixed-Signal Systems Xia, Likun Bell, Ian Wilkinson, Antony TK Electrical engineering. Electronics Nuclear engineering In the modern analogue design, Transistor Level Fault Simulation (TLFS) plays the important part since every fault in the whole circuit has to be simulated at that level. Unfortunately, it is a very CPU intensive task even though it maintains the high accuracy. Therefore, High Level Fault Modeling (HLFM) and High Level Fault Simulation (HLFS) are required in order to alleviate the efforts of simulation. In this paper, different HLFM approaches are reviewed at the device level during last two decades. We clarify their domains of application and evaluate their strengths and current limitations. We also analyze causes of faults and introduce various test approaches. Springer 2011-07 Article PeerReviewed application/pdf http://eprints.utp.edu.my/6145/1/fulltext.pdf Xia, Likun and Bell, Ian and Wilkinson, Antony (2011) Review of High Level Fault Modeling Approaches for Mixed-Signal Systems. JOURNAL OF ELECTRONICS (CHINA), 27 (4). pp. 490-497. ISSN 02179822 http://eprints.utp.edu.my/6145/
institution Universiti Teknologi Petronas
building UTP Resource Centre
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Petronas
content_source UTP Institutional Repository
url_provider http://eprints.utp.edu.my/
topic TK Electrical engineering. Electronics Nuclear engineering
spellingShingle TK Electrical engineering. Electronics Nuclear engineering
Xia, Likun
Bell, Ian
Wilkinson, Antony
Review of High Level Fault Modeling Approaches for Mixed-Signal Systems
description In the modern analogue design, Transistor Level Fault Simulation (TLFS) plays the important part since every fault in the whole circuit has to be simulated at that level. Unfortunately, it is a very CPU intensive task even though it maintains the high accuracy. Therefore, High Level Fault Modeling (HLFM) and High Level Fault Simulation (HLFS) are required in order to alleviate the efforts of simulation. In this paper, different HLFM approaches are reviewed at the device level during last two decades. We clarify their domains of application and evaluate their strengths and current limitations. We also analyze causes of faults and introduce various test approaches.
format Article
author Xia, Likun
Bell, Ian
Wilkinson, Antony
author_facet Xia, Likun
Bell, Ian
Wilkinson, Antony
author_sort Xia, Likun
title Review of High Level Fault Modeling Approaches for Mixed-Signal Systems
title_short Review of High Level Fault Modeling Approaches for Mixed-Signal Systems
title_full Review of High Level Fault Modeling Approaches for Mixed-Signal Systems
title_fullStr Review of High Level Fault Modeling Approaches for Mixed-Signal Systems
title_full_unstemmed Review of High Level Fault Modeling Approaches for Mixed-Signal Systems
title_sort review of high level fault modeling approaches for mixed-signal systems
publisher Springer
publishDate 2011
url http://eprints.utp.edu.my/6145/1/fulltext.pdf
http://eprints.utp.edu.my/6145/
_version_ 1738655466005725184
score 13.212271

Similar Items