Automatic generation of test instructions for path delay faults based-on stuck-at fault in processor cores using assignment decision diagram

• Main Authors: Shaheen, A.-U.-R., Hussin, F.A., Hamid, N.H., Ali, N.B.Z.
• Format: Conference or Workshop Item
• Published: IEEE Computer Society 2014
• Online Access: https://www.scopus.com/inward/record.uri?eid=2-s2.0-84906350466&doi=10.1109%2fICIAS.2014.6869530&partnerID=40&md5=4acc1a9593a3b00bf33b65139d9313d0; http://eprints.utp.edu.my/32104/

This paper proposes a satisfiability-based automatic test instruction program generation to test the path delay faults using stuck-at fault in processor cores. Pre-computed test vectors are applied using the test instructions during normal processor execution. The proposed framework uses the assignm...