Modified short-run statistical process control for test and measurement process
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Springer London
2019
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| Online Access: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85054607120&doi=10.1007%2fs00170-018-2776-1&partnerID=40&md5=295bffc954d2e830a677f795d757f7d5 http://eprints.utp.edu.my/25118/ |
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my.utp.eprints.251182021-08-27T08:27:07Z Modified short-run statistical process control for test and measurement process Koh, C.K. Chin, J.F. Kamaruddin, S. Springer London 2019 Article NonPeerReviewed https://www.scopus.com/inward/record.uri?eid=2-s2.0-85054607120&doi=10.1007%2fs00170-018-2776-1&partnerID=40&md5=295bffc954d2e830a677f795d757f7d5 Koh, C.K. and Chin, J.F. and Kamaruddin, S. (2019) Modified short-run statistical process control for test and measurement process. International Journal of Advanced Manufacturing Technology, 100 (5-8). pp. 1531-1548. http://eprints.utp.edu.my/25118/ |
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Article |
| author |
Koh, C.K. Chin, J.F. Kamaruddin, S. |
| spellingShingle |
Koh, C.K. Chin, J.F. Kamaruddin, S. Modified short-run statistical process control for test and measurement process |
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Koh, C.K. Chin, J.F. Kamaruddin, S. |
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Koh, C.K. |
| title |
Modified short-run statistical process control for test and measurement process |
| title_short |
Modified short-run statistical process control for test and measurement process |
| title_full |
Modified short-run statistical process control for test and measurement process |
| title_fullStr |
Modified short-run statistical process control for test and measurement process |
| title_full_unstemmed |
Modified short-run statistical process control for test and measurement process |
| title_sort |
modified short-run statistical process control for test and measurement process |
| publisher |
Springer London |
| publishDate |
2019 |
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https://www.scopus.com/inward/record.uri?eid=2-s2.0-85054607120&doi=10.1007%2fs00170-018-2776-1&partnerID=40&md5=295bffc954d2e830a677f795d757f7d5 http://eprints.utp.edu.my/25118/ |
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