Modified short-run statistical process control for test and measurement process

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Bibliographic Details
Main Authors: Koh, C.K., Chin, J.F., Kamaruddin, S.
Format: Article
Published: Springer London 2019
Online Access:https://www.scopus.com/inward/record.uri?eid=2-s2.0-85054607120&doi=10.1007%2fs00170-018-2776-1&partnerID=40&md5=295bffc954d2e830a677f795d757f7d5
http://eprints.utp.edu.my/25118/
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