Enhanced Trench Shielded Power UMOSFET for Single Event Burnout Hardening
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| Main Authors: | , , , |
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| Format: | Conference or Workshop Item |
| Published: |
Institute of Electrical and Electronics Engineers Inc.
2019
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| Online Access: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85078311992&doi=10.1109%2fRSM46715.2019.8943495&partnerID=40&md5=7c8ac635c0f811653efb271a9f089524 http://eprints.utp.edu.my/24992/ |
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