Study of time-dependent dielectric breakdown (TDDB) in 15MM junctionless FinFET
As MOSFETs already reached the limitation in terms of physical and electrical characteristic which is difficult to continue producing with MOSFET due to the level of difficulty and complexity. Although, FinFETs provide several advantages but there are some drawbacks of FinFETs such as higher fabrica...
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Format: | Thesis |
Language: | English |
Published: |
2022
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Online Access: | http://eprints.utm.my/id/eprint/99382/1/ChngSzeLynMSKE2022.pdf http://eprints.utm.my/id/eprint/99382/ http://dms.library.utm.my:8080/vital/access/manager/Repository/vital:150057 |
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