The development of BEEM modeling for the characterization of Si/Ge self-assembled quantum dot heterostructures

• Main Authors: Hutagalung, Sabar D., Yaacob, Khatijah A., Sakrani, Samsudi, Mat Isa, Ahmad R.
• Format: Conference or Workshop Item
• Language: English
• Published: 2006
• Subjects: QC Physics
• Online Access: http://eprints.utm.my/id/eprint/7792/1/Samsudi_Bin_Sakrani_2006_The_Development_Of_BEEM_Modelling.pdf; http://eprints.utm.my/id/eprint/7792/; http://dx.doi.org/10.1109/NANOEL.2006.1609735

In this paper we present a ballistic electron emission microscopy (BEEM) modeling for the Si/Ge quantum dots characterization. BEEM is a new characterization technique by using electrons ejected from the scanning tunneling microscopy (STM) tip to investigate the metal-semiconductor interfaces. Becau...