Sputtered CuO mono-phase thin films: structural, compositional and spectroscopic linear/nonlinear optical characteristics
Mono phase CuO thin films through DC sputtering at various oxygen pressure (10, 20, 30, 40 sccm) was deposited on glass substrate. The structural analyses of the DC sputtered thin films were performed through X-ray diffraction (XRD) technique. The atomic force microscope (AFM) exposed the variation...
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Main Authors: | , , , , |
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Format: | Article |
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Elsevier GmbH
2017
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Online Access: | http://eprints.utm.my/id/eprint/77002/ https://www.scopus.com/inward/record.uri?eid=2-s2.0-85022068123&doi=10.1016%2fj.ijleo.2017.06.075&partnerID=40&md5=4e21c49da6354b54dc9b324e68edbbe8 |
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