Thermoluminescence properties of Yb–Tb-Doped SiO2 optical fiber subjected to 1.25 MeV gamma radiation

A thermoluminescence (TL) analysis was carried out to study the sensitivity and dose responses of Yb–Tb-doped SiO2 optical fiber subjected to 1.25 MeV gamma radiation. The results are compared with the commercially available standard LiF:Mg, Ti (TLD-100) chip. The Yb–Tb-doped SiO2 optical fiber and...

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Main Authors: Hossain, I., Wagiran, H., Sahini, M. H.
Format: Article
Published: Springer New York LLC 2017
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Online Access:http://eprints.utm.my/id/eprint/76429/
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85017441667&doi=10.1007%2fs10812-017-0442-2&partnerID=40&md5=59e4e7fb4283d179cad12d6105a679d1
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spelling my.utm.764292018-04-30T13:21:24Z http://eprints.utm.my/id/eprint/76429/ Thermoluminescence properties of Yb–Tb-Doped SiO2 optical fiber subjected to 1.25 MeV gamma radiation Hossain, I. Wagiran, H. Sahini, M. H. QC Physics A thermoluminescence (TL) analysis was carried out to study the sensitivity and dose responses of Yb–Tb-doped SiO2 optical fiber subjected to 1.25 MeV gamma radiation. The results are compared with the commercially available standard LiF:Mg, Ti (TLD-100) chip. The Yb–Tb-doped SiO2 optical fiber and TLD-100 chips were placed inside Perspex and irradiated with 1.25 MeV gamma photons with doses ranging from 1.0 to 10.00 Gy. The results clearly show the superiority of TLD-100 chips in terms of response and sensitivity. The sensitivity of Yb–Tb-doped optical fiber and TLD-100 chips is 45.25 and 768.85 nc/(mg × Gy) respectively. Springer New York LLC 2017 Article PeerReviewed Hossain, I. and Wagiran, H. and Sahini, M. H. (2017) Thermoluminescence properties of Yb–Tb-Doped SiO2 optical fiber subjected to 1.25 MeV gamma radiation. Journal of Applied Spectroscopy, 84 (1). pp. 144-147. ISSN 0021-9037 https://www.scopus.com/inward/record.uri?eid=2-s2.0-85017441667&doi=10.1007%2fs10812-017-0442-2&partnerID=40&md5=59e4e7fb4283d179cad12d6105a679d1 DOI:10.1007/s10812-017-0442-2
institution Universiti Teknologi Malaysia
building UTM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Malaysia
content_source UTM Institutional Repository
url_provider http://eprints.utm.my/
topic QC Physics
spellingShingle QC Physics
Hossain, I.
Wagiran, H.
Sahini, M. H.
Thermoluminescence properties of Yb–Tb-Doped SiO2 optical fiber subjected to 1.25 MeV gamma radiation
description A thermoluminescence (TL) analysis was carried out to study the sensitivity and dose responses of Yb–Tb-doped SiO2 optical fiber subjected to 1.25 MeV gamma radiation. The results are compared with the commercially available standard LiF:Mg, Ti (TLD-100) chip. The Yb–Tb-doped SiO2 optical fiber and TLD-100 chips were placed inside Perspex and irradiated with 1.25 MeV gamma photons with doses ranging from 1.0 to 10.00 Gy. The results clearly show the superiority of TLD-100 chips in terms of response and sensitivity. The sensitivity of Yb–Tb-doped optical fiber and TLD-100 chips is 45.25 and 768.85 nc/(mg × Gy) respectively.
format Article
author Hossain, I.
Wagiran, H.
Sahini, M. H.
author_facet Hossain, I.
Wagiran, H.
Sahini, M. H.
author_sort Hossain, I.
title Thermoluminescence properties of Yb–Tb-Doped SiO2 optical fiber subjected to 1.25 MeV gamma radiation
title_short Thermoluminescence properties of Yb–Tb-Doped SiO2 optical fiber subjected to 1.25 MeV gamma radiation
title_full Thermoluminescence properties of Yb–Tb-Doped SiO2 optical fiber subjected to 1.25 MeV gamma radiation
title_fullStr Thermoluminescence properties of Yb–Tb-Doped SiO2 optical fiber subjected to 1.25 MeV gamma radiation
title_full_unstemmed Thermoluminescence properties of Yb–Tb-Doped SiO2 optical fiber subjected to 1.25 MeV gamma radiation
title_sort thermoluminescence properties of yb–tb-doped sio2 optical fiber subjected to 1.25 mev gamma radiation
publisher Springer New York LLC
publishDate 2017
url http://eprints.utm.my/id/eprint/76429/
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85017441667&doi=10.1007%2fs10812-017-0442-2&partnerID=40&md5=59e4e7fb4283d179cad12d6105a679d1
_version_ 1643657308495937536
score 13.160551