An accurate operation of wideband multi-port reflectometer with new calibration method implementing least mean square for microwave imaging application
The wideband operation of multi-port reflectometer may lead to inaccurate reflection coefficient measurement caused by the overlapped phase characteristics of the used calibration standards. Therefore, a calibration procedure implementing Least Mean Square (LMS) is proposed to offer accurate operati...
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| Main Authors: | , |
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| Format: | Article |
| Published: |
Penerbit UTM Press
2015
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| Subjects: | |
| Online Access: | http://eprints.utm.my/id/eprint/57731/ http://dx.doi.org/10.11113/jt.v73.4256 |
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| Summary: | The wideband operation of multi-port reflectometer may lead to inaccurate reflection coefficient measurement caused by the overlapped phase characteristics of the used calibration standards. Therefore, a calibration procedure implementing Least Mean Square (LMS) is proposed to offer accurate operation of wideband multi-port reflectometer from 1 to 6 GHz. Its well wideband performance is verified by attenuators of 3, 6 and 10 dB that assessed as the device under tests (DUTs). The proposed LMS contains a learning rate, m and updated weight coefficient, W(k+1) to eliminate error and achieve the corrected reflection coefficient of DUT |
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