Device modelling of archimedean spiral graphene nanoscroll field-effect-transistor

For the past decades, researchers indicate that persistent scaling of conventional silicon Metal-Oxide-Semiconductor Field Effect Transistor (MOSFET) reaching its physical limit at 10nm, resulted in its performance degradation as the search continues for a low-power and high speed, density and relia...

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Bibliographic Details
Main Author: Hamzah, Muhammad Afiq Nurudin
Format: Thesis
Language:English
Published: 2014
Subjects:
Online Access:http://eprints.utm.my/id/eprint/50698/25/MuhammadAfiqNurudinMFKE2014.pdf
http://eprints.utm.my/id/eprint/50698/
http://dms.library.utm.my:8080/vital/access/manager/Repository/vital:92100
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