IC test based on scan cell
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2001
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| Online Access: | http://eprints.utm.my/id/eprint/43231/ |
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my.utm.432312014-11-02T03:30:00Z http://eprints.utm.my/id/eprint/43231/ IC test based on scan cell Rahiman, Rosdina TK Electrical engineering. Electronics Nuclear engineering 2001 Thesis NonPeerReviewed Rahiman, Rosdina (2001) IC test based on scan cell. Masters thesis, Universiti Teknologi Malaysia, Faculty of Electrical Engineering. |
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Universiti Teknologi Malaysia |
| building |
UTM Library |
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Institutional Repository |
| continent |
Asia |
| country |
Malaysia |
| content_provider |
Universiti Teknologi Malaysia |
| content_source |
UTM Institutional Repository |
| url_provider |
http://eprints.utm.my/ |
| topic |
TK Electrical engineering. Electronics Nuclear engineering |
| spellingShingle |
TK Electrical engineering. Electronics Nuclear engineering Rahiman, Rosdina IC test based on scan cell |
| format |
Thesis |
| author |
Rahiman, Rosdina |
| author_facet |
Rahiman, Rosdina |
| author_sort |
Rahiman, Rosdina |
| title |
IC test based on scan cell |
| title_short |
IC test based on scan cell |
| title_full |
IC test based on scan cell |
| title_fullStr |
IC test based on scan cell |
| title_full_unstemmed |
IC test based on scan cell |
| title_sort |
ic test based on scan cell |
| publishDate |
2001 |
| url |
http://eprints.utm.my/id/eprint/43231/ |
| _version_ |
1643651129716768768 |
| score |
13.15806 |