Built-in self test for phase-locked loop
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my.utm.326572013-12-17T03:52:48Z http://eprints.utm.my/id/eprint/32657/ Built-in self test for phase-locked loop Goh, Alvin Shing Chye QA75 Electronic computers. Computer science 2008 Thesis NonPeerReviewed Goh, Alvin Shing Chye (2008) Built-in self test for phase-locked loop. Masters thesis, Universiti Teknologi Malaysia, Faculty of Electrical Engineering. |
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QA75 Electronic computers. Computer science Goh, Alvin Shing Chye Built-in self test for phase-locked loop |
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Goh, Alvin Shing Chye |
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Goh, Alvin Shing Chye |
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Goh, Alvin Shing Chye |
title |
Built-in self test for phase-locked loop
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title_short |
Built-in self test for phase-locked loop
|
title_full |
Built-in self test for phase-locked loop
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Built-in self test for phase-locked loop
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Built-in self test for phase-locked loop
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built-in self test for phase-locked loop |
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2008 |
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http://eprints.utm.my/id/eprint/32657/ |
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1643649105146150912 |
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13.18916 |