Built-in self test for phase-locked loop
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2008
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my.utm.326572013-12-17T03:52:48Z http://eprints.utm.my/id/eprint/32657/ Built-in self test for phase-locked loop Goh, Alvin Shing Chye QA75 Electronic computers. Computer science 2008 Thesis NonPeerReviewed Goh, Alvin Shing Chye (2008) Built-in self test for phase-locked loop. Masters thesis, Universiti Teknologi Malaysia, Faculty of Electrical Engineering. |
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Asia |
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Malaysia |
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Universiti Teknologi Malaysia |
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| topic |
QA75 Electronic computers. Computer science |
| spellingShingle |
QA75 Electronic computers. Computer science Goh, Alvin Shing Chye Built-in self test for phase-locked loop |
| format |
Thesis |
| author |
Goh, Alvin Shing Chye |
| author_facet |
Goh, Alvin Shing Chye |
| author_sort |
Goh, Alvin Shing Chye |
| title |
Built-in self test for phase-locked loop
|
| title_short |
Built-in self test for phase-locked loop
|
| title_full |
Built-in self test for phase-locked loop
|
| title_fullStr |
Built-in self test for phase-locked loop
|
| title_full_unstemmed |
Built-in self test for phase-locked loop
|
| title_sort |
built-in self test for phase-locked loop |
| publishDate |
2008 |
| url |
http://eprints.utm.my/id/eprint/32657/ |
| _version_ |
1643649105146150912 |
| score |
13.18916 |